USB4 CM to CM Gen3 240W 高速数据线
Type C Gen3 公头转 USB4 A 公头 40Gbps 240W 8k 电视显示线
USB4 240W高速充电传输线 PD3.1快充 8K60Hz 40Gbps
●8k 5k电视显示
●兼容Thunderbolt 3跟DP 1.4,支援Alt Mode,最高支援8k@60Hz影像传输
Type of Date Cable | USB-IF 认证 USB4 40gbps Cable USB4 Cabel USB 4 Cable USB4 Thunderbolt 4 Cabel Thunderbolt 4 Cable |
导体 | 镀银铜 |
材料 | TPE 护套 & TPE 外壳 & 同轴线 |
外径 | 5.2m m |
E-mark晶片 | Cypress 2103晶片 |
包装 | PE袋/支援客制化品牌包 装 |
连接器类型 | USB C 型 |
电缆类型 | USB |
相容设备 | MacBook Pro/Air、iPad Pro/Air、iMac Pro、Mac Mini/Pro/Studio、iPhone 15 Pro/Pro Max(配备 USB-C 连接器)以及更多 USB-C HP/DELL 笔记型电脑、平板电脑、Google Pixel 7/6、Galaxy S24/S23 智慧型手机、LG/Samsung/萤幕显示器 |
功能 | 1. 100W 电力传输:USB 4 电缆最高相容 20V/5A 100W 充电。 2.高达 40Gbps 的传输速度: 40Gbps可以在一分钟内以高达 40 Gbps 的速度复制 14 小时的高清影片或 25,000 张照片。 3.最大8K视讯输出:8K@60HZ视讯解析度。4.支援PCIE 32GB 5.支援PD 3.0快速充电 6.採用原厂Cypress Chip 赛普拉斯晶片2103 7.相容 thunderbolt 3 & thunderbolt 4 8.240W 快速充电、40、8K@60Hz 视讯显示、编织、高速 |
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
Cable | USB4 Type-C to Type-C Cable Assembly: Gen3 | N/A | Pass |
Group B-1 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-1-1 Electronic Marking | Electronic Marking,as required, matches the cable assembly capabilities. | N/A | Pass |
B-1-2 Cable Pull-Out | No physical damage and electrical discontinuity. | 38D | Pass |
B-1-3 Cable Flexing | No loss of continuity during cycling. | 41E | Pass |
B-1-5: Voltage Drop | 250 mV for GND and 500 mV for VBUS. | N/A | Pass |
Group B-2 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-2-1 : D+/D-Pair Attenuation | a-1.52 dB @ 50 MHz a-2.03 dB @100 MHz a-2.91 dB @200 MHz a-4.35 dB @400 MHz | 101 | Pass |
B-2-2: D+/D- Pair Differential Impedance | 75 ohms to 105 ohms | N/A | Pass |
B-2-3: D+/D- Pair Propagation Delay | 20 ns max | 103 | Pass |
B-2-4: D+/D- Intra-Pair Skew | 100 ps max | 103 | Pass |
B-2-5: Coupling between CC and Differential USB D+/D- | (0.3 MHz, -60.5 dB), (1 MHz, -50 dB), (10 MHz, -30 dB), (16 MHz, -26 dB) (100 MHz, -26 dB). | 90 | Pass |
B-2-6: Coupling between VBUS and Differential USB D+/D- | ñ -40 dB for 0.3 MHz<fñ30 MHz, ñ 19.12 Iog10(f/30)-40 (in dB) for 30 MHz< f a 100 MHz. | 90 | Pass |
B-2-7: Single- ended Coupling between SBU-A and CC /SBU-B and cC. | (0.3 MHz, -65 dB), (1 MHz, -55 dB), (18 MHz, -30 dB), (100 MHz, -30 dB). | 90 | Pass |
B-2-8: Single- ended Coupling between CC and D- | (0.3 MHz, -58 dB), (10 MHz, -27.5 dB), (11.8 MHz, -26 dB), (100 MHz, -26 dB) | 90 | Pass |
B-2-9: Single- ended Coupling between SBU-A and SBU-B. | (0.3 MHz, -56.5 dB), (1 MHz, -46 dB), (10 MHz, -26 dB), (11.2 MHz, -25 dB), (100 MHz, -25 dB). | 90 | Pass |
B-2-10: Coupling between SBU-A/SBU-B and Differential USB D+/D— | (0.3 MHz, -80 dB), (30 MHz, —40 dB) (100 MHz, —40 dB). | 9o | Pass |
B-2-11 : VBUS loop inductance | '< 900 nH | N/A | Pass |
B-2-12: VBUS Capacitance (Does not apply to USB 2.0 only cable assembly) | 8nF to 500nF | N/A | Pass |
B-2-13: Mutual Inductance between VBUS and Other Low Speed Signals (CC, SBU-A, SBU-B, D+, and D-) | M(VBUS, D+)/M(VBUS, D-) : <=330 nH M(VBUS,CC): <=350 nH M(VBUS,SBU-A)/M(VBUS,SBU-B): <=330 nH | N/A | Pass |
B-2-16: D+ and D- DC Resistance | 3.5 ohms max. | N/A | Pass |
Group B-3 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-3-1 : Insertion Loss Fit at Nyquist Frequencies (ILfitatNq) | For all USB 3.2 Gen 2 pairs: * -4 dB at 2.5 GHz * -6 dB at 5 GHz * -11 dB at 10 GHz | N/A | Pass |
B-3-2: Integrated Multi-reflection (IMR) | 0.126 ILfitatNq^2+ 3.024 ILfitatNq — 23.392 in dB. | N‹A | Pass |
B-3-3: Integrated Crosstalk on SuperSpeed Pairs (INEXT and IFEXT) | Integrated crosstalk: ñ -40 dB to 12.5GHz | N/A | Pass |
B-3-4: Integrated Crosstalk between SuperSpeed Pairs and D+/D-(IDDXT-1NEXT +FEXT and, IDDXT-2NEXT) | Integrated near-end crosstalk to D+/D-: IDDXT-2NEXT a -33 dB Integrated near-end and far-end crosstalk to D+/D-: IDDXT-1NEXT+FEXT :s -34.5 dB For all SuperSpeed pairs. | N/A | Pass |
B-3-6: Integrated Return Loss (IRL) | a 0.046 ILfitatNq^2 + 1.812 ILfitatNq — 10.784 in dB | N‹A | Pass |
B-3-7: Differential-to -Common-Mode Conversion (SCD12/SCD21) | -20dB from 100 MHz to 10 GHz | N/A | Pass |
Group B-4 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-4-1: Cable Shielding Effectiveness | Differential model: -55 dB for f 1.6 GHz -50 dB for 1.6 GHz ñ f ñ 4.0 GHz and for 5 GHz ñ f ñ 6 GHz Common model: a-40 dB for fa1.6 GHz -35 dB for 1.6 GHz ñ f ñ 4 GHz and for 5 GHz ñ f ñ 6 GHz | N/A | Pass |
Group B-5 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-5-1: Critical Dimension | Meet all critical dimension requirements defined in Compliance Document | N/A | Pass |
Group B-7 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-7-1 Wrenching Strength-a | No damage has occurred that causes discontinuity or shorting. | N‹A | Pass |
B-7-2 Continuity | No discontinuities or shorts allowed. | N/A | Pass |
B-7-3 Dielectric withstanding voltage | No disruptive discharge. | 20E | Pass |
B-7-4 Wrenching Strength-b | The plug shall disengage from the test fixture or mechanically fail when a moment of 2.0 Nm is applied in the up and down directions and a moment 3.5 Nm is applied in the left and right directions. | N/A | Pass |
Group B-8 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-8-1 : Insertion Loss Fit at Nyquist Frequencies (ILfitatNq) | For USB 4 Gen 3 pairs: * -1 dB at 100 MHz, * -4.2 dB at 2.5 GHz, * -6 dB at 5 GHz, * -7.5 dB at 10 GHz, * -9.3 dB at 12.5 GHz, and * -11 dB at 15 GHz. | N/A | Pass |
B-8-2: Integrated Crosstalk on SuperSpeed Pairs (INEXT and IFEXT) | For USB4 Gen 3 pairs: The total crosstaIk,IXT-DP and IXT-USB: IXT-DP/IXT-USB a (ILfit-10Ghz+7.5) “2/3.5 -41, dB, -4 a ILfit-1OG ñ -7.5 a -39, dB, ILfit-1OG a -4 dB | N/A | Pass |
B-8-3: Integrated Crosstalk between SuperSpeed Pairs and D+/D-(IDDXT-1NEXT +FEXT and, IDDXT-2NEXT) | Integrated near-end crosstalk to D+/D-: IDDXT-1NEXT+FEXT a -34.5 dB Integrated near-end and far-end crosstalk to D+/D-: IDDXT-2NEXT a -33 dB For all SuperSpeed pairs. | N/A | Pass |
B-8-4: Integrated Return Loss (IRL) | For USB 4 Gen 3 pairs: a (ILfit-10Ghz+7.5) *3.5/3.5 -19.5 dB -4 ñ ILfit-1OG ñ -7.5 ñ -16, dB, ILfit-1OG ñ -4 dB | N/A | Pass |
B-8-5: Differential-to -Common-Mode Conversion (SCD12/SCD21) | -17 dB from 100 MHz to 10 GHz. | N/A | |
B-8-6: Threshold | For USB 4 Gen 3 pairs: 3 dB, | N/A | Pass |
1. Equipment Under Test (EUT) and Ancillary Equipment (AE)
Cable | |||
Manufacturer's Name | Dongguan Xunguang Electronics Co.,Ltd | ||
Product Marketing Name | USB4 CM TO CM (Gen3)240W | ||
Model/Part Number | XG80188 | ||
Product Revision | A | ||
Cable Assembly Length | 1m | ||
Current Rating | 5A | ||
USB-IF TID Number | 8888 | ||
Condition of EUT as received | No abnormality in appearance | ||
Connector | |||
Manufacturer's Name | All Best Electronic Technology Co.,Ltd | ||
Product Marketing Name | TYPE-C USB4 Plug Connector | ||
Model/Part Number | A140-C24136A3-1H | ||
Product Revision | A | ||
USB-IF TID Number | 3928 | ||
USB-IF TID Certification Date | 2020-08-17 | ||
Sample Coding | |||
Test Group | Number of Plug/Receptacle | Qty of Specimen | |
Group B-1 | B1-1 to B1-8 | 8 pcs | |
Group B-2 | B2-1 to B2-3 | 3 pcs | |
Group B-3 | B3-1 to B3-3 | 3 pcs | |
Group B-4 | B4-1 to B4-3 | 3 pcs | |
Group B-5 | B5-1 to B5-3 | 3 pcs | |
Group B-7 | B7-1 to B7-15 | 15 pcs | |
Group B-8 | B8-1 to B8-10 | 10 pcs(Out of 50 pcs) |
1.1. Testing Environment Normal Temperature: 15-35”C Relative Humidity: 25-85%RH Atmospheric pressure 86-106kPa
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B-1-2 Cable Pull Out | |||
Testing Period | Measure environment | Test Engineer | Test Result |
2022/10/12 | Temp. 22.6 ”C/ 54.3 %RH | Liu Baoming | Pass |
Test condition | Mated; Force: 40N minimum; Duration: 1 min | ||
Criteria | No physical damage and electrical discontinuity. |
B-1-3 Cable Flexing | |||
Testing Period | Measure environment | Test Engineer | Test Result |
2022/10/12 | Temp. 22.6 ”C/ 54.3 %RH | Liu Baoming | Pass |
Test condition | Mated; Speed: 13 cycles/minute; 500 cycles Flexing at 2 planes; +60°(total 120°) Weight: 1 pound | ||
Criteria | No physical damage and electrical discontinuity. |
B-1-5 Voltage Drop | |||
Testing Period | Measure environment | Test Engineer | Test Result |
2022/10/11 | Temp. 23.3 ”C/ 53.2 %RH | Zhan Xingcheng | Pass |
Test condition | Testing voltage: 48Vdc Testing current: 5A | ||
Criteria | 250 mV for GND and 500 mV for VBUS. |
Test data: | ||
B-1-5 Voltage Drop | ||
Sample Coding | Vbus mV) | GND mV) |
B1-1 | 390.2 | 148.2 |
B1-2 | 391.7 | 140.1 |
B1-3 | 383.9 | 120.8 |
B1-4 | 391.2 | 147.9 |
B1-5 | 389.3 | 129.6 |
B1-6 | 384.4 | 134.7 |
B1-7 | 392.7 | 140.4 |
B1-8 | 391.2 | 142.2 |
Group B-2
B-2 USB 2.0 and Low Speed | Signal Tests of Type-C Cable Assemblies | |||
Testing Period | Measure environment | Test Engineer | Test Result | |
2022/10/11 | Temp. 24.4 ”C/ 44.4 %RH | Zeng Huinan | Pass | |
Test | Test Conditions | |||
B-2-1: D+/D-Pair Attenuation | Frequency range: 10MHz to 500MHz; IF Bandwidth: 1kHz Number of Point: 500 | |||
B-2-2: D+/D- Pair Differential Impedance | Rise time: | 400ps (20-80%) | ||
B-2-3: D+/D- Pair Propagation Delay | Rise time: 400ps (20-80%) rise time at 50% voltage crossing | |||
B-2-4: D+/D- Intra-Pair Skew | Rise time: 400ps (20-80%) rise time at 50% voltage crossing | |||
B-2-5: Coupling between CC and Differential USB D+/D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-6: Coupling between VBUS and Differential USB D+/D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-7: Single- ended Coupling between SBU-A and CC /SBU-B and CG. | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-8: Single- ended Coupling between CC and D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-9: Single- ended Coupling between SBU-A and SBU-B. | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-10: Coupling between SBU-A/SBU-B and Differential USB D+/D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-11 : VBUS loop inductance | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-12: VBUS Capacitance (Does not apply to USB 2.0 only cable assembly) | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-13: Mutual Inductance between VBUS and Other Low Speed Signals (CC, SBU-A, SBU-B, D+, and D-) | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-16 : D+ and D- | Ohmmeter measurement from connector to connector of the D+ |
DC Resistance | line and the D- line. |
Criteria | All samples met the signal integrity requirements as USB Type-C specified and tool (IntePar). Please refer to Table 1-3. |
Test data: | ||||
B-2-1: D+/D-Pair Attenuation | Requirement | Sample Coding | ||
B2-1 | B2-2 | B2-3 | ||
-0.5901 | -0.6007 | -0.5991 | ||
-0.7010 | -0.7074 | -0.7119 | ||
-1.0329 | -1.0307 | -1.0444 | ||
-1.6531 | -1.6639 | -1.6746 | ||
B-2-2: D+/D- Pair Differential Impedance | Max. 105Ct | 93.276 | 92.848 | 92.476 |
Min.75D | 78.131 | 77.745 | 77.541 | |
B-2-3: D+/D- Pair Propagation Delay | 20ns max. (Unit: ns) | 4.9503 | 4.9527 | 4.9861 |
B-2-4: D+/D- Intra-Pair Skew | 100ps max. (Unit: ps) | 5.8854 | 10.458 | 7.8281 |
B-2-16 : D+ and D- DC Resistance | D+ 3.5DMax. | 2.6 | 2.6 | 3.0 |
D- 3.5CIMax. | 2.7 | 2.5 | 3.0 |
Table 1 Low Speed result for Sample B2-1 | |||
Value | Margin/Criteria | Pass/Fail | |
CC to D+/D- | 15.5dB | Pass | |
CC to D-, FF | 6dB | Pass | |
VBUS to D+/D- | 34.2dB | Pass | |
SBU-A/SBU-B to CC | 7.3dB | Pass | |
SBU-A/SBU-B to D+/D- | 5dB | Pass | |
SBU-A to SBU-B | 10.2dB | Pass | |
VBUS Lloop | 65 nH | <= 900 nH | Pass |
VBUS Cap | 32 nF | 8-500 nF | Pass |
M(VBUS,D+)/M(VBUS,D-) | 6.11/21.15 nH | <=300 nH | Pass |
M(VBUS,CC) | 0 nH | <=350 nH | Pass |
M(VBUS,SBU-A)/M(VBUS,SBU-B) | 1.19/5.11 nH | <=330 nH | Pass |
Table 2 Low Speed result for Sample B2-2 | |||
Value | Margin/Criteria | Pass/Fail | |
CC to D+/D- | 15dB | Pass | |
CC to D-, FF | 6.4dB | Pass | |
VBUS to D+/D- | 29.9dB | Pass | |
SBU-A/SBU-B to CC | 8.3dB | Pass | |
SBU-A/SBU-B to D+/D- | 4.6dB | Pass | |
SBU-A to SBU-B | 20.3dB | Pass | |
VBUS Lloop | 87 nH | <= 900 nH | Pass |
VBUS Cap | 37 nF | 8-500 nF | Pass |
M(VBUS,D+)/M(VBUS,D-) | 11.14/36.75 nH | <=300 nH | Pass |
M(VBUS,CC) | 0 nH | <=350 nH | Pass |
M(VBUS,SBU-A)/M(VBUS,SBU-B) | 3.99/4.9 nH | <=330 nH | Pass |
Table 3 Low Speed result for Sample B2-3 | |||
Value | Margin/Criteria | Pass/Fail | |
CC to D+/D- | 15dB | Pass | |
CC to D-, FF | 6.1dB | Pass | |
VBUS to D+/D- | 33.7dB | Pass | |
SBU-A/SBU-B to CC | 7.7dB | Pass | |
SBU-A/SBU-B to D+/D- | 3.3dB | Pass | |
SBU-A to SBU-B | 13.9dB | Pass | |
VBUS Lloop | 100.8 nH | <= 900 nH | Pass |
VBUS Cap | 29 nF | 8-500 nF | Pass |
M(VBUS,D+)/M(VBUS,D-) | 21.39/24.96 nH | <=300 nH | Pass |
M(VBUS,CC) | 0 nH | <=350 nH | Pass |
M(VBUS,SBU-A)/M(VBUS,SBU-B) | 4.65/3.99 nH | <=330 nH | Pass |
金涞电子有限公司USB4 CM to CM Gen3 240W 高速数据线
欢迎来电洽询!
Type C Gen3 公头转 USB4 A 公头 40Gbps 240W 8k 电视显示线
USB4 240W高速充电传输线 PD3.1快充 8K60Hz 40Gbps
●8k 5k电视显示
●兼容Thunderbolt 3跟DP 1.4,支援Alt Mode,最高支援8k@60Hz影像传输
Type of Date Cable | USB-IF 认证 USB4 40gbps Cable USB4 Cabel USB 4 Cable USB4 Thunderbolt 4 Cabel Thunderbolt 4 Cable |
导体 | 镀银铜 |
材料 | TPE 护套 & TPE 外壳 & 同轴线 |
外径 | 5.2m m |
E-mark晶片 | Cypress 2103晶片 |
包装 | PE袋/支援客制化品牌包 装 |
连接器类型 | USB C 型 |
电缆类型 | USB |
相容设备 | MacBook Pro/Air、iPad Pro/Air、iMac Pro、Mac Mini/Pro/Studio、iPhone 15 Pro/Pro Max(配备 USB-C 连接器)以及更多 USB-C HP/DELL 笔记型电脑、平板电脑、Google Pixel 7/6、Galaxy S24/S23 智慧型手机、LG/Samsung/萤幕显示器 |
功能 | 1. 100W 电力传输:USB 4 电缆最高相容 20V/5A 100W 充电。 2.高达 40Gbps 的传输速度: 40Gbps可以在一分钟内以高达 40 Gbps 的速度复制 14 小时的高清影片或 25,000 张照片。 3.最大8K视讯输出:8K@60HZ视讯解析度。4.支援PCIE 32GB 5.支援PD 3.0快速充电 6.採用原厂Cypress Chip 赛普拉斯晶片2103 7.相容 thunderbolt 3 & thunderbolt 4 8.240W 快速充电、40、8K@60Hz 视讯显示、编织、高速 |
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
Cable | USB4 Type-C to Type-C Cable Assembly: Gen3 | N/A | Pass |
Group B-1 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-1-1 Electronic Marking | Electronic Marking,as required, matches the cable assembly capabilities. | N/A | Pass |
B-1-2 Cable Pull-Out | No physical damage and electrical discontinuity. | 38D | Pass |
B-1-3 Cable Flexing | No loss of continuity during cycling. | 41E | Pass |
B-1-5: Voltage Drop | 250 mV for GND and 500 mV for VBUS. | N/A | Pass |
Group B-2 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-2-1 : D+/D-Pair Attenuation | a-1.52 dB @ 50 MHz a-2.03 dB @100 MHz a-2.91 dB @200 MHz a-4.35 dB @400 MHz | 101 | Pass |
B-2-2: D+/D- Pair Differential Impedance | 75 ohms to 105 ohms | N/A | Pass |
B-2-3: D+/D- Pair Propagation Delay | 20 ns max | 103 | Pass |
B-2-4: D+/D- Intra-Pair Skew | 100 ps max | 103 | Pass |
B-2-5: Coupling between CC and Differential USB D+/D- | (0.3 MHz, -60.5 dB), (1 MHz, -50 dB), (10 MHz, -30 dB), (16 MHz, -26 dB) (100 MHz, -26 dB). | 90 | Pass |
B-2-6: Coupling between VBUS and Differential USB D+/D- | ñ -40 dB for 0.3 MHz<fñ30 MHz, ñ 19.12 Iog10(f/30)-40 (in dB) for 30 MHz< f a 100 MHz. | 90 | Pass |
B-2-7: Single- ended Coupling between SBU-A and CC /SBU-B and cC. | (0.3 MHz, -65 dB), (1 MHz, -55 dB), (18 MHz, -30 dB), (100 MHz, -30 dB). | 90 | Pass |
B-2-8: Single- ended Coupling between CC and D- | (0.3 MHz, -58 dB), (10 MHz, -27.5 dB), (11.8 MHz, -26 dB), (100 MHz, -26 dB) | 90 | Pass |
B-2-9: Single- ended Coupling between SBU-A and SBU-B. | (0.3 MHz, -56.5 dB), (1 MHz, -46 dB), (10 MHz, -26 dB), (11.2 MHz, -25 dB), (100 MHz, -25 dB). | 90 | Pass |
B-2-10: Coupling between SBU-A/SBU-B and Differential USB D+/D— | (0.3 MHz, -80 dB), (30 MHz, —40 dB) (100 MHz, —40 dB). | 9o | Pass |
B-2-11 : VBUS loop inductance | '< 900 nH | N/A | Pass |
B-2-12: VBUS Capacitance (Does not apply to USB 2.0 only cable assembly) | 8nF to 500nF | N/A | Pass |
B-2-13: Mutual Inductance between VBUS and Other Low Speed Signals (CC, SBU-A, SBU-B, D+, and D-) | M(VBUS, D+)/M(VBUS, D-) : <=330 nH M(VBUS,CC): <=350 nH M(VBUS,SBU-A)/M(VBUS,SBU-B): <=330 nH | N/A | Pass |
B-2-16: D+ and D- DC Resistance | 3.5 ohms max. | N/A | Pass |
Group B-3 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-3-1 : Insertion Loss Fit at Nyquist Frequencies (ILfitatNq) | For all USB 3.2 Gen 2 pairs: * -4 dB at 2.5 GHz * -6 dB at 5 GHz * -11 dB at 10 GHz | N/A | Pass |
B-3-2: Integrated Multi-reflection (IMR) | 0.126 ILfitatNq^2+ 3.024 ILfitatNq — 23.392 in dB. | N‹A | Pass |
B-3-3: Integrated Crosstalk on SuperSpeed Pairs (INEXT and IFEXT) | Integrated crosstalk: ñ -40 dB to 12.5GHz | N/A | Pass |
B-3-4: Integrated Crosstalk between SuperSpeed Pairs and D+/D-(IDDXT-1NEXT +FEXT and, IDDXT-2NEXT) | Integrated near-end crosstalk to D+/D-: IDDXT-2NEXT a -33 dB Integrated near-end and far-end crosstalk to D+/D-: IDDXT-1NEXT+FEXT :s -34.5 dB For all SuperSpeed pairs. | N/A | Pass |
B-3-6: Integrated Return Loss (IRL) | a 0.046 ILfitatNq^2 + 1.812 ILfitatNq — 10.784 in dB | N‹A | Pass |
B-3-7: Differential-to -Common-Mode Conversion (SCD12/SCD21) | -20dB from 100 MHz to 10 GHz | N/A | Pass |
Group B-4 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-4-1: Cable Shielding Effectiveness | Differential model: -55 dB for f 1.6 GHz -50 dB for 1.6 GHz ñ f ñ 4.0 GHz and for 5 GHz ñ f ñ 6 GHz Common model: a-40 dB for fa1.6 GHz -35 dB for 1.6 GHz ñ f ñ 4 GHz and for 5 GHz ñ f ñ 6 GHz | N/A | Pass |
Group B-5 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-5-1: Critical Dimension | Meet all critical dimension requirements defined in Compliance Document | N/A | Pass |
Group B-7 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-7-1 Wrenching Strength-a | No damage has occurred that causes discontinuity or shorting. | N‹A | Pass |
B-7-2 Continuity | No discontinuities or shorts allowed. | N/A | Pass |
B-7-3 Dielectric withstanding voltage | No disruptive discharge. | 20E | Pass |
B-7-4 Wrenching Strength-b | The plug shall disengage from the test fixture or mechanically fail when a moment of 2.0 Nm is applied in the up and down directions and a moment 3.5 Nm is applied in the left and right directions. | N/A | Pass |
Group B-8 | |||
Test Group/Test | SPEC/Requirement | EIA 364 | Result |
B-8-1 : Insertion Loss Fit at Nyquist Frequencies (ILfitatNq) | For USB 4 Gen 3 pairs: * -1 dB at 100 MHz, * -4.2 dB at 2.5 GHz, * -6 dB at 5 GHz, * -7.5 dB at 10 GHz, * -9.3 dB at 12.5 GHz, and * -11 dB at 15 GHz. | N/A | Pass |
B-8-2: Integrated Crosstalk on SuperSpeed Pairs (INEXT and IFEXT) | For USB4 Gen 3 pairs: The total crosstaIk,IXT-DP and IXT-USB: IXT-DP/IXT-USB a (ILfit-10Ghz+7.5) “2/3.5 -41, dB, -4 a ILfit-1OG ñ -7.5 a -39, dB, ILfit-1OG a -4 dB | N/A | Pass |
B-8-3: Integrated Crosstalk between SuperSpeed Pairs and D+/D-(IDDXT-1NEXT +FEXT and, IDDXT-2NEXT) | Integrated near-end crosstalk to D+/D-: IDDXT-1NEXT+FEXT a -34.5 dB Integrated near-end and far-end crosstalk to D+/D-: IDDXT-2NEXT a -33 dB For all SuperSpeed pairs. | N/A | Pass |
B-8-4: Integrated Return Loss (IRL) | For USB 4 Gen 3 pairs: a (ILfit-10Ghz+7.5) *3.5/3.5 -19.5 dB -4 ñ ILfit-1OG ñ -7.5 ñ -16, dB, ILfit-1OG ñ -4 dB | N/A | Pass |
B-8-5: Differential-to -Common-Mode Conversion (SCD12/SCD21) | -17 dB from 100 MHz to 10 GHz. | N/A | |
B-8-6: Threshold | For USB 4 Gen 3 pairs: 3 dB, | N/A | Pass |
1. Equipment Under Test (EUT) and Ancillary Equipment (AE)
Cable | |||
Manufacturer's Name | Dongguan Xunguang Electronics Co.,Ltd | ||
Product Marketing Name | USB4 CM TO CM (Gen3)240W | ||
Model/Part Number | XG80188 | ||
Product Revision | A | ||
Cable Assembly Length | 1m | ||
Current Rating | 5A | ||
USB-IF TID Number | 8888 | ||
Condition of EUT as received | No abnormality in appearance | ||
Connector | |||
Manufacturer's Name | All Best Electronic Technology Co.,Ltd | ||
Product Marketing Name | TYPE-C USB4 Plug Connector | ||
Model/Part Number | A140-C24136A3-1H | ||
Product Revision | A | ||
USB-IF TID Number | 3928 | ||
USB-IF TID Certification Date | 2020-08-17 | ||
Sample Coding | |||
Test Group | Number of Plug/Receptacle | Qty of Specimen | |
Group B-1 | B1-1 to B1-8 | 8 pcs | |
Group B-2 | B2-1 to B2-3 | 3 pcs | |
Group B-3 | B3-1 to B3-3 | 3 pcs | |
Group B-4 | B4-1 to B4-3 | 3 pcs | |
Group B-5 | B5-1 to B5-3 | 3 pcs | |
Group B-7 | B7-1 to B7-15 | 15 pcs | |
Group B-8 | B8-1 to B8-10 | 10 pcs(Out of 50 pcs) |
1.1. Testing Environment Normal Temperature: 15-35”C Relative Humidity: 25-85%RH Atmospheric pressure 86-106kPa
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B-1-2 Cable Pull Out | |||
Testing Period | Measure environment | Test Engineer | Test Result |
2022/10/12 | Temp. 22.6 ”C/ 54.3 %RH | Liu Baoming | Pass |
Test condition | Mated; Force: 40N minimum; Duration: 1 min | ||
Criteria | No physical damage and electrical discontinuity. |
B-1-3 Cable Flexing | |||
Testing Period | Measure environment | Test Engineer | Test Result |
2022/10/12 | Temp. 22.6 ”C/ 54.3 %RH | Liu Baoming | Pass |
Test condition | Mated; Speed: 13 cycles/minute; 500 cycles Flexing at 2 planes; +60°(total 120°) Weight: 1 pound | ||
Criteria | No physical damage and electrical discontinuity. |
B-1-5 Voltage Drop | |||
Testing Period | Measure environment | Test Engineer | Test Result |
2022/10/11 | Temp. 23.3 ”C/ 53.2 %RH | Zhan Xingcheng | Pass |
Test condition | Testing voltage: 48Vdc Testing current: 5A | ||
Criteria | 250 mV for GND and 500 mV for VBUS. |
Test data: | ||
B-1-5 Voltage Drop | ||
Sample Coding | Vbus mV) | GND mV) |
B1-1 | 390.2 | 148.2 |
B1-2 | 391.7 | 140.1 |
B1-3 | 383.9 | 120.8 |
B1-4 | 391.2 | 147.9 |
B1-5 | 389.3 | 129.6 |
B1-6 | 384.4 | 134.7 |
B1-7 | 392.7 | 140.4 |
B1-8 | 391.2 | 142.2 |
Group B-2
B-2 USB 2.0 and Low Speed | Signal Tests of Type-C Cable Assemblies | |||
Testing Period | Measure environment | Test Engineer | Test Result | |
2022/10/11 | Temp. 24.4 ”C/ 44.4 %RH | Zeng Huinan | Pass | |
Test | Test Conditions | |||
B-2-1: D+/D-Pair Attenuation | Frequency range: 10MHz to 500MHz; IF Bandwidth: 1kHz Number of Point: 500 | |||
B-2-2: D+/D- Pair Differential Impedance | Rise time: | 400ps (20-80%) | ||
B-2-3: D+/D- Pair Propagation Delay | Rise time: 400ps (20-80%) rise time at 50% voltage crossing | |||
B-2-4: D+/D- Intra-Pair Skew | Rise time: 400ps (20-80%) rise time at 50% voltage crossing | |||
B-2-5: Coupling between CC and Differential USB D+/D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-6: Coupling between VBUS and Differential USB D+/D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-7: Single- ended Coupling between SBU-A and CC /SBU-B and CG. | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-8: Single- ended Coupling between CC and D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-9: Single- ended Coupling between SBU-A and SBU-B. | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-10: Coupling between SBU-A/SBU-B and Differential USB D+/D- | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-11 : VBUS loop inductance | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-12: VBUS Capacitance (Does not apply to USB 2.0 only cable assembly) | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-13: Mutual Inductance between VBUS and Other Low Speed Signals (CC, SBU-A, SBU-B, D+, and D-) | Frequency range: 300kHz to 100MHz; IF Bandwidth: 1kHz Number of Point: 1995 Power level: +10dBm | |||
B-2-16 : D+ and D- | Ohmmeter measurement from connector to connector of the D+ |
DC Resistance | line and the D- line. |
Criteria | All samples met the signal integrity requirements as USB Type-C specified and tool (IntePar). Please refer to Table 1-3. |
Test data: | ||||
B-2-1: D+/D-Pair Attenuation | Requirement | Sample Coding | ||
B2-1 | B2-2 | B2-3 | ||
-0.5901 | -0.6007 | -0.5991 | ||
-0.7010 | -0.7074 | -0.7119 | ||
-1.0329 | -1.0307 | -1.0444 | ||
-1.6531 | -1.6639 | -1.6746 | ||
B-2-2: D+/D- Pair Differential Impedance | Max. 105Ct | 93.276 | 92.848 | 92.476 |
Min.75D | 78.131 | 77.745 | 77.541 | |
B-2-3: D+/D- Pair Propagation Delay | 20ns max. (Unit: ns) | 4.9503 | 4.9527 | 4.9861 |
B-2-4: D+/D- Intra-Pair Skew | 100ps max. (Unit: ps) | 5.8854 | 10.458 | 7.8281 |
B-2-16 : D+ and D- DC Resistance | D+ 3.5DMax. | 2.6 | 2.6 | 3.0 |
D- 3.5CIMax. | 2.7 | 2.5 | 3.0 |
Table 1 Low Speed result for Sample B2-1 | |||
Value | Margin/Criteria | Pass/Fail | |
CC to D+/D- | 15.5dB | Pass | |
CC to D-, FF | 6dB | Pass | |
VBUS to D+/D- | 34.2dB | Pass | |
SBU-A/SBU-B to CC | 7.3dB | Pass | |
SBU-A/SBU-B to D+/D- | 5dB | Pass | |
SBU-A to SBU-B | 10.2dB | Pass | |
VBUS Lloop | 65 nH | <= 900 nH | Pass |
VBUS Cap | 32 nF | 8-500 nF | Pass |
M(VBUS,D+)/M(VBUS,D-) | 6.11/21.15 nH | <=300 nH | Pass |
M(VBUS,CC) | 0 nH | <=350 nH | Pass |
M(VBUS,SBU-A)/M(VBUS,SBU-B) | 1.19/5.11 nH | <=330 nH | Pass |
Table 2 Low Speed result for Sample B2-2 | |||
Value | Margin/Criteria | Pass/Fail | |
CC to D+/D- | 15dB | Pass | |
CC to D-, FF | 6.4dB | Pass | |
VBUS to D+/D- | 29.9dB | Pass | |
SBU-A/SBU-B to CC | 8.3dB | Pass | |
SBU-A/SBU-B to D+/D- | 4.6dB | Pass | |
SBU-A to SBU-B | 20.3dB | Pass | |
VBUS Lloop | 87 nH | <= 900 nH | Pass |
VBUS Cap | 37 nF | 8-500 nF | Pass |
M(VBUS,D+)/M(VBUS,D-) | 11.14/36.75 nH | <=300 nH | Pass |
M(VBUS,CC) | 0 nH | <=350 nH | Pass |
M(VBUS,SBU-A)/M(VBUS,SBU-B) | 3.99/4.9 nH | <=330 nH | Pass |
Table 3 Low Speed result for Sample B2-3 | |||
Value | Margin/Criteria | Pass/Fail | |
CC to D+/D- | 15dB | Pass | |
CC to D-, FF | 6.1dB | Pass | |
VBUS to D+/D- | 33.7dB | Pass | |
SBU-A/SBU-B to CC | 7.7dB | Pass | |
SBU-A/SBU-B to D+/D- | 3.3dB | Pass | |
SBU-A to SBU-B | 13.9dB | Pass | |
VBUS Lloop | 100.8 nH | <= 900 nH | Pass |
VBUS Cap | 29 nF | 8-500 nF | Pass |
M(VBUS,D+)/M(VBUS,D-) | 21.39/24.96 nH | <=300 nH | Pass |
M(VBUS,CC) | 0 nH | <=350 nH | Pass |
M(VBUS,SBU-A)/M(VBUS,SBU-B) | 4.65/3.99 nH | <=330 nH | Pass |
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